ETC Brunel hosts an extensive electron microscopy suite comprising of a state of the art TEM, as well as a FIB-SEM, FEG-SEM and tungsten thermo-ionic emission SEM. The Zeiss Supra and Crossbeam are ultra-high performance field emission scanning electron microscopes, with both high-vacuum and variable operating pressure (VP) capability.
Top range scanning TEM with CL and EELS
The Jeol 2100F Field Emission Gun Transmission Electron Microscope is a state of the art high resolution microscope capable of imaging at the sub-nanometre scale and, when coupled with our Gatan Vulcan system for cathodoluminescence, it is a unique system within the UK and 1 of only a handful within the world. Together with the extensive preparation suite and FIB-SEM, the TEM is a highly useful analytical tool capable of analysing samples from many scientific disciples.
- Gatan GIF Quantum Image Filtering/Electron Energy Loss Spectrometer
- Thermo-Fisher Scientific Energy Dispersive X-ray Spectrometer
- Scanning TEM, for mapping features, including elemental and CL signal mapping
- Electron diffraction, for crystalline information
- Tomography, for 3 dimension TEM imaging.
FIB SEM for high resolution analysis and sample preparation for TEM and single crystal X-ray
The field emission source and Gemini column in this instrument result in a very high resolution capability. Added functionality of the gallium ion gun allows for advanced TEM sample preparation as well as 3D imaging and compositional analysis.
- High Vacuum and variable pressure
- 3D EBSD mapping
- TEM sample preparation
The SEMs at ETC are equipped with a selection of analytical techniques for material composition and phase detection. These include energy-dispersive x-ray analysis (EDX), back-scattered electron detection (BSE) and electron back-scattered diffraction (EBSD). The Zeiss Supra is also equipped with a cold stage allowing examination of moist materials. This combination of features enables optimum performance for a range of sample types.
Zeiss Supra 35VP
FEG-SEM capable of high resolution imaging, EDX analysis and EBSD mapping
A large chamber and Tungsten filament allows for a wide range of samples