ETC also hosts a number of X-ray techniques which provide qualitative and quantitative analysis of crystalline material characteristics and mechanical properties.
Single Crystal X-ray Diffraction
Rigaku Oxford single crystal X-ray diffractometer for elucidating molecular and solid-state structures
Our single crystal X-ray diffractometer allows for complete structural characterisation by providing a complete three-dimensional structure showing molecular and solid-state identity, conformation and stereochemistry.
- Dual wavelength Cu/Ag high flux micro-focus X-ray source
- Atlas CCD detector
- Temperature range 80K - 500K
- Up to 20GPa applied pressure
Identification and analysis of crystalline materials
Our X-Ray diffraction facilities include copper, molybdenum and chromium tubes. The equipment has two setting for routine phase identification and a ¼ cradle setting for residual stress, multi-layer and polar analyses.
- Copper for routine analyses
- Molybdenum for materials with small unit cells
- Chromium for residual stress analyses
Oxford instruments ED2000 for high resolution elemental detection
Trace elements can be detected using our Oxford instruments ED2000 fitted with a silver tube and a variety of aluminium filters for analysis in air or helium.
- Elemental and chemical analysis
- Detect at a parts per million level