Dr Ian Dear
ECE Deputy Head (Taught Programmes)
Brunel University
Uxbridge
UB8 3PH
United Kingdom
Summary
Research and Teaching
Research Interests
Digital systems, test technology.
Publications
Publications
Journal Papers
(2009) Morris, A., Maharaj, C., Kourmpetis, M., Dear, I., Puri, A. and Dear, J., Optical strain measurement techniques to assist in life monitoring of power plant components, Journal of Pressure Vessel Technology, Transactions of the ASME 131 (2)
(2007) Morris, A., Kourmpetis, M., Dear, ID., Sjodahl, M. and Dear, JP., Optical strain monitoring techniques for life assessment of components in power generation plants, Proceedings of the Institution of Mechanical Engineers, Part A: Journal of Power and Energy 221 (8) : 1141- 1152
(1994) Dear, ID., Dislis, CD., Ambler, AP. and Dick, J., Test strategy planning using economic analysis, Journal of Electronic Testing 5 (2-3) : 137- 155
(1991) Dear, ID., Dislis, C., Ambler, AP. and Dick, J., Economic effects in design and test, IEEE Design and Test of Computers 8 (4) : 64- 77
Conference Papers
(1993) Dislis, C., Dick, JH., Dear, ID., Azu, IN. and Ambler, AP., Economics modeling for the determination of test strategies for complex VLSI boards, International Test Conference 1993: Designing, Testing, and Diagnostics - Join Them
