The 16th IFIP TC 6 / WG 6.1 International Conference on Testing of Communicating Systems (TestCom 2004)

The 16th IFIP TC 6 / WG 6.1 International Conference on Testing of Communicating Systems (TestCom 2004)
St Anne's College, Oxford, United Kingdom, 17-19th March 2004.

There is a new web page. Please see www.testcom2004.org.

SCOPE AND OBJECTIVES

TestCom is a series of international working conferences on testing communicating systems. TestCom focuses on the testing of communicating systems within all application domains. Examples of such application domains include, but are not limited to, the automobile industry, avionics, banking, e-commerce, health, military, and telecommunications systems.

TestCom will provide a forum for researchers, vendors and users to review, discuss and learn about new approaches, concepts and experiences in the field of testing of communicating systems. The conference will consist of tutorial sessions, presentations of reviewed and invited papers, industrial experience reports, demonstrations of tools, and panel and discussion sessions.

The conference will be held at St Anne's College, Oxford.

ORGANISERS

The IFIP 16th International Conference on Testing of Communicating Systems (TestCom 2004) is organized by Brunel University (UK) and LSR-IMAG (France).

KEYNOTE SPEAKER

Professor Sir Tony Hoare, Microsoft Research

TOPICS OF INTEREST

These include, but are not restricted to

Types of testing: Functional testing, Conformance testing, Interoperability testing, Performance testing, Scalability/Stress testing, Robustness testing, Usability testing, Regression testing.
Industrial testing experience: successes and failures of testing communicating systems, case studies, empirical studies.
Classes of systems to be tested: Embedded systems, Real-time systems, E-commerce systems, Mobile systems, Protocols, Multimedia systems, Middleware platforms, Next Generation Networks, Distributed systems.
Phases of testing: Test case generation, Test setup and execution, Test selection and management, Test coverage and results analysis.
Theory and Practice of testing: Theoretical frameworks, Test specification, Test derivation, Validation and Analysis, Applications of testing theory, Test standards, Test tools.
Issues in testing within particular application domains.
Service platforms: Vocal servers, PF for Web services, OSA/Parlay, Jain etc.

TYPES OF PAPERS

Several Types of Contributions are solicited

Full papers research or practice results (no more than 16 pages)
Industrial experience reports (no more than 16 pages)
Position statements/poster papers work in progress (no more than 5 pages)
Tool demonstration proposals
Tutorial proposals

Only original papers (not submitted or published elsewhere) should be submitted.

PUBLICATION

All full papers and industrial experience reports will be published in a volume of Lecture Notes in Computer Science (LNCS) . Please check the author details for information regarding the required format.

IMPORTANT DATES

October 13, 2003 - Submission deadline for full papers and industrial experience reports.
December 1, 2003 - Notification of acceptance.
December 15, 2003 - Submission deadline for position/poster papers.
January 5, 2004 - Camera-ready copy of full papers and industrial experience reports.
January 9, 2004 - Proposals for tool demonstrations.
Conference: 17-19 March 2004.

SUBMITTING PAPERS

Papers should be emailed to testcom2004@brunel.ac.uk, along with a statement as to which class of paper it is. These papers should be in LNCS style (see above) and should be submitted either in PDF or Ghostview readable Postscript.

STEERING COMMITTEE

S. T. Chanson (Hong Kong University, China)
R. Groz (LSR-IMAG, France)
G. Leduc, Chairman (University of Liege, Belgium)
A. Petrenko (CRIM, Canada)

PROGRAM CO-CHAIRS

R. M. Hierons (Brunel University, UK)
R. Groz (LSR-IMAG, France)

TECHNICAL PROGRAM COMMITTEE

G. v. Bochmann, University of Ottawa, Canada
A. R. Cavalli, INT, France
J. Clark, York University, UK
R. Dssouli, Concordia University, Canada
S. Dibuz, Ericsson, Hungary
P. Frankl, Polytechnic University, USA
J. Grabowski, University of Göttingen, Germany
M. Harman, Brunel University, UK
K. Harrison, Praxis Critical Systems, UK
T. Higashino, Osaka University, Japan
D. Hogrefe, University of Goettingen, Germany
T. Jeron, IRISA, France
M. Kim, ICU University, Korea
D. Lee, Bell Labs Research, USA
G. Maggiore, TIM, Italy
J. Offutt, George Mason University, USA
I. Schieferdecker, Fraunhofer FOKUS, Germany
K. Suzuki, Kennisbron Co., Ltd., Japan
J. Tretmans, University of Nijmegen, The Netherlands
A. Ulrich, Siemens, Germany
H. Ural, University of Ottawa, Canada
M. U. Uyar, City University of New York, USA
J. Wegener, DaimlerChrysler AG, Germany
A. Wiles, ETSI, France
J. Wu , Tsinghua University, China
N. Yevtushenko, Tomsk State University, Russia

ORGANISATION COMMITTEE

H. Zhu, Oxford Brookes University
K. Derderian, Brunel University
Q. Guo, Brunel University
M. Parmar, Brunel University

FURTHER INFORMATION

For further information, such as sponsorship opportunities, please contact testcom2004@brunel.ac.uk

In the event of persistent email/system failures, you may post papers to:

Professor Robert M. Hierons
Department of Information Systems and Computing,
Brunel University,
Uxbridge, Middlesex,
UB8 3PH United Kingdom

Authors of accepted papers are expected to attend.