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Field emission SEM

ETCbrunel operates a Zeiss Supra 35VP, an ultra-high performance field emission scanning electron microscope, with both high-vacuum and variable operating pressure (VP) capability. The field emission source and Gemini column in this instrument result in a very high resolution capability, and this is complemented by the variable pressure system, which enables imaging and analysis of samples in their natural state, without artifacts due to surface charging. This allows non-destructive examination of environmentally sensitive samples as well as insulating samples. The instrument is also equipped with a cold stage allowing examination of moist materials. This combination of features enables optimum performance for a range of sample types. The FEG-SEM at ETC is equipped with a suite of analytical techniques for material composition and phase detection. These include energy-dispersive x-ray analysis (EDX), back-scattered electron detection (BSE) and electron back-scattered diffraction (EBSD).

Researchers at Brunel have utilised this FEG-SEM in many scientific areas: for example, in developing low adherence coatings for machining applications, incorporation of trace elements into surfaces of orthopaedic devices, degradation of novel materials for ultra-fast warm-cathode heater packages, and investigations of nano-phosphors. A current intra-university project utilises electron backscatter diffraction (EBSD) analysis for examination of rheo-diecast aluminium-magnesium alloys.

ETC operates a well-established booking system for departmental staff, internal University users, and external work. We currently offer access through a service for short analyses; for longer projects access can be arranged as part of a collaboration, and we also train users to operate instruments, allowing full access with supervision where required.

In addition to extensive skills in microscopy, the ETCbrunel team has expertise in many application areas, including mechanical engineering, metallurgy, environmental materials, electronics, biomedical materials, thin films and forensics. This broad collective experience enables support for users from diverse fields. For more details on this instrument, please contact Dr Alan Reynolds