TOF-SIMS
The Kore SurfaceSeer Time of Flight – Secondary Ion Mass Spectrometer (ToF-SIMS) is a state of the art spectrometer that allows for the simultaneous analysis of elements and molecular fragments of the top 1-2 nanometres of a surface. ToF-SIMS is nowadays the most sensitive of all the commonly-employed surface analytical techniques, and provides a unique combination of high sensitivity for atoms (from Hydrogen to Uranium), clusters of atoms and molecular fragments. Additionally, the instrument´s imaging capacity allows the possibility to obtain spatially-resolved analysis of any sample that can stay under vacuum.
For more details about this instrument please contact Dr Jesus J Ojeda
Mass spectrum of a Copper Grid on Aluminium foil (top) and the chemical distribution of Copper (Cu), Aluminium (Al) and Sodium (Na) on the surface of the grid (bottom) scanned with the new Kore SurfaceSeer ToF-SIMS instrument at ETCbrunel.
