
Dr Soohyun Jeon
Lecturer in Information Systems
Eastern Gateway 201 Desk 7
- Email: soohyun.jeon@brunel.ac.uk
- Tel: +44 (0)1895 265258
- Innovation and Sustainability
- Brunel Business School
- College of Business, Arts and Social Sciences
Hyewon, L., Saerom, L., Dongheon, K. and Jeon, S. (2024) 'The Impact of Social Media Affordances on Benign Envy: A Focus on Fuzzy Set Qualitative Comparative Analysis (fsQCA)'. [unpublished]
Lee, H., Lee, S. and Jeon, S. (2024) 'Effects of SNS Affordances on Benign and Malicious Envy'.KrAIS Workshop 2024. Seoul. South Korea. [unpublished]
Jeon, S., Son, I. and Han, J. (2022) 'Understanding employee's emotional reactions to ISSP compliance: focus on frustration from security requirements'. Behaviour & Information Technology, 42 (13). pp. 2093 - 2110. ISSN: 0144-929X
Jeon, S., Son, I. and Han, J. (2021) 'Exploring the role of intrinsic motivation in ISSP compliance: enterprise digital rights management system case'. Information Technology & People, 34 (2). pp. 599 - 616. ISSN: 0959-3845 Open Access Link
Jeon, S., Hovav, A., Han, J. and Alter, S. (2018) 'Rethinking the Prevailing Security Paradigm'. ACM SIGMIS Database: the DATABASE for Advances in Information Systems, 49 (3). pp. 54 - 77. ISSN: 0095-0033
Jeon, S. and Anat, Z-H. (2018) 'A Novel Method to Enhance ISSP Compliant: an Approach Drawing Upon the Concept of Empowerment in Erm System Workflow'.Hawaii International Conference on System Sciences. Hilton Waikoloa Village, Hawaii, USA. 3 - 6 January. Hawaii International Conference on System Sciences. pp. 5585 - 5594. ISSN: 1530-1605 Open Access Link
Lee, H., Jeon, S. and Zeelim-Hovav, A. (2016) 'Impact of psychological empowerment, position and awareness of audit on information security policy compliance intention'. Pacific Asia Conference on Information Systems Pacis 2016 Proceedings.
Jeon, S. and Hovav, A. (2015) 'Empowerment or control: Reconsidering employee security policy compliance in terms of authorization'.2015 48th Hawaii International Conference on System Sciences (HICSS). IEEE. pp. 3473 - 3482. ISSN: 1530-1605