Jeol 2100F FEG 200kV HR-TEM (0.2nm resolution), with STEM; 120kV, 100kV and 80kV; selected area and convergent beam diffraction; and tomography. Attached are: a Gatan Vulcan Cathode-luminescence detector; Gatan GIF Quantum GIF/EELS energy filter; Gatan Orius Camera; with Gatan Microscopy Suite V.3; and a Thermo-Scientific Ultra-Dry SDD EDX system with NSS software.
Zeiss Supra 35VP FEG SEM, with variable kV (0.2-30kV); variable pressure; secondary and back-scatter electron and high-resolution (~20nm) imaging. Attached are: an EDAX Octane Super SDD EDX and Pegasus EBSD systems with TEAM and OIM software packages.
Jeol JXA-840A 20kV tungsten SEM, with 5kV and 10kV; secondary and back-scatter electron (~100nm resolution) imaging. Attached is a Oxford E5574 SiLi EDX detector; Avalon digital imaging system and Spirit software
Veeco Dimension 3100AFM (4.8um-~10nm Z-height resolution)
Zeiss FIB with 3-dimensional EDX and EBSD and correlative LM-TEM capabilities (Arriving in Nov 2016)
ETC is a multidisciplinary research institute specialising in high level characterisation and analysis of a wide spectrum of materials. By fostering an interdisciplinary philosophy, it serves as a hub to the broader university community, encompassing bioengineering and biosciences, the environment, and an extensive range of engineering. Furthermore, ETC provides an accredited evaluation service to both local and international industries and a wealth of collaborative research opportunities for external research and development enterprises.
Gatan Plasma Ion Poilishing System, with cryo-preparation capabilities
Gatan ultra-sonic disc cutter and dimple grinder
Gatan Plasma Cleaner (O2 and H2)
RMC PT-PC ultramicrotome with cryo-sectioning capabilities
Quorum Sputter Coater
Agar Carbon Coater with metal evaporation capabilities
Mechanical polishing wheels
Agar Critical Point Drier
Tenu-pol Electropolishing system with cryo capabilities
Resin embedding expertise for TEM or SEM preparation
Fixation and staining expertise of biological tissues for TEM and SEM
Laarman super fine mill
Zeiss FIB for TEM cross sections
Gatan GMS 3
Thermi-scientific NSS EDX analysis
The latest addition to our suite is a Zeiss Crossbeam 340 scanning electron microscope (SEM) with focused ion beam, to complement the recently acquired JEOL 2100 FEG-TEM transmission electron microscope (TEM) with cathodoluminescence (CL). A full list of our investigation techniques can be found at our characterisation facilities page. ETC also runs a range of advanced training courses in analytical techniques.
For further information on our work or services, or to obtain the website content in brochure format, please see contact details, or get in touch with any of our staff.