Kore SurfaceSeer Time of Flight - Secondary Ion Mass Spectrometry

At the Experimental Techniques Centre, we have a number of techniques and instruments to cater for a wide variety of materials, samples and products.

Kore SurfaceSeer Time of Flight – Secondary Ion Mass Spectrometer (ToF-SIMS) is a state of the art spectrometer that allows for the simultaneous analysis of elements and molecular fragments of a surface. The most sensitive of all the commonly-employed surface analytical techniques, SIMS provides a unique combination of high sensitivity for atoms (from Hydrogen to Uranium), clusters of atoms and molecular fragments.

1-2 nanometre surface penetration
High sensitivity
Full atomic range
Spatially-resolved analysis

Kore SurfaceSeer Time of Flight - Secondary Ion Mass Spectrometry

At the Experimental Techniques Centre, we have a number of techniques and instruments to cater for a wide variety of materials, samples and products.

For more information or to discuss your XRD requirements, please contact our Scientific Officer Team at etc@brunel.ac.uk