Surface Roughness

Our facilities include Atomic Force Microscopy for measuring and characterising surface properties of materials. 

Atomic force microscopy is ideal for analysing micro and nano-scale surface features, from surface roughness to micro friction and electrical properties.

  • Determine Ra and Rq values, as well as skewness and kurtosis
  • Measure electrical properties of the surface
  • From <1µm up to 100µm scan size

  • Maximum roughness (Z range) is up to 4.5µm

AFM 01
AFM 01

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Atomic Force Microscopy

Topographic quantification of nao and micro surface structures

 

For more information or to discuss your surface roughness measurements, please contact Dr Wayne Lam at wayne.lam@brunel.ac.uk

You can return to our main Commercial Services page to see what else we have that could support your requirements.