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Dr Nila Nilavalan
Reader / Head of Department - EEE

Membership and affiliation

Professional Memberships and Services

  • Senior member of the IEEE
  • Member of the IET
  • Fellow of the Higher Education Academy


         Craddock IJ, Preece A, Nilavalan R, Leendertz J, Benjamin R, Wilson FJ, Methods and apparatus for measuring the internal structure of an object 

         Patent number: EP 1850743 B1 (EU & Japan). Application number: EP 06704227 A 20060130. Patent status: Granted. Filed date: 29 Apr 2015