Dr Nila Nilavalan
Reader / Head of Department - EEE
Membership and affiliation
Professional Memberships and Services
- Senior member of the IEEE
- Member of the IET
- Fellow of the Higher Education Academy
Patent:
Craddock IJ, Preece A, Nilavalan R, Leendertz J, Benjamin R, Wilson FJ, Methods and apparatus for measuring the internal structure of an object
Patent number: EP 1850743 B1 (EU & Japan). Application number: EP 06704227 A 20060130. Patent status: Granted. Filed date: 29 Apr 2015